Research Article
Open Access
Dielectric relaxation studies of Schiff bases in Dimethyl Sulfoxide (DMSO) using Time Domain Reflectometry(TDR)
R. K. Pardeshi*
Department of Chemistry, Sant Ramdas College, Ghansawangi Dist. Jalna – 431 209. India.
R. K. Pardeshi /Int.J. Chemical Concepts. 2016,2(2),pp 82-87.
Abstract
Static permittivity and relaxation times have been determined for four Schiff bases derived
from 2-hydroxy-1-naphthaldehyde with o-substituted anilines in Dimethylsulfoxide (DMSO) solution by
using a Time Domain Reflectometry (TDR) technique. The observations are taken at room temperature
(30°C) in frequency range 10 MHz to 20 GHz. Fourier transform and least squares fit methods have been
used to obtain dielectric parameters.The excess dielectric parameters have also been determined for the
system. In the present investigation it is observed that there is change in dielectric parameters of the
system with change in concentrations.
Keywords
Time Domain Reflectometer, Schiff Bases, Dielectric Relaxation Studies
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